Focused Ion Beam Systems: Basics and Applications. Nan Yao

Focused Ion Beam Systems: Basics and Applications


Focused.Ion.Beam.Systems.Basics.and.Applications.pdf
ISBN: 0521831997,9780521831994 | 408 pages | 21 Mb

Download Focused Ion Beam Systems: Basics and Applications



Focused Ion Beam Systems: Basics and Applications Nan Yao
Publisher: Cambridge University Press


Book Description

This edited volume comprehensively covers the focused ion beam and two beam technology. Presenting the basic principles, capabilities, challenges, advantages, applications and when best to implement the technology, this is a valuable resource for researchers in materials science, electrical engineering and nanotechnology.

About the Author

NAN YAO holds several positions at Princeton University, New Jersey. He is director of the Imaging and Analysis Center; Senior Research Scholar at the Institute for the Science and Technology of Materials; and a lecturer in Mechanical and Aerospace Engineering.



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